Why choose a JEOL scanning electron microscope?

JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.

What is JEOL electron beam lithography?

The JEOL Electron Beam Lithography system is capable of providing patterned features with dimensions down to 20nm and pattern to pattern overlay of <40nm. Training on this tool requires pre-requisite training on other techniques: metrology, photoresist coating, metal deposition and SEM analysis.

What is JEOL's analytical series?

Our analytical series includes JEOL ’s fully embedded EDS system which provides real time EDS spectra during image observation. With Live Analysis you can: View EDS spectra in real time as you search for the area of interest. Set analysis points, areas, map positions and line scans from the live image observation screen.

Does JEOL have any agency relationship with Ervin Danesh Aryan Company?

2017/05/30 JEOL Ltd. express ourselves that we as JEOL Ltd. and any of our affiliates have concluded no agency relationship and no contractual relationship with Ervin Danesh Aryan Company in Islamic Republic of Iran on our manufactures and sell, services and any others in all cases in the past and current business.

Jeol Specs - Finder Manual

Q: What is JEOL's analytical series?

Our analytical series includes JEOL ’s fully embedded EDS system which provides real time EDS spectra during image observation. With Live Analysis you can: View EDS spectra in real time as you search for the area of interest. Set analysis points, areas, map positions and line scans from the live image observation screen.

Q: Does JEOL have any agency relationship with Ervin Danesh Aryan Company?

2017/05/30 JEOL Ltd. express ourselves that we as JEOL Ltd. and any of our affiliates have concluded no agency relationship and no contractual relationship with Ervin Danesh Aryan Company in Islamic Republic of Iran on our manufactures and sell, services and any others in all cases in the past and current business.

Listing Results Jeol Specs

About 19 results and 4 answers.

EDS Analysis Large Angle SDD-EDS Supplier - JEOL USA

Key Features
High sensitivity, high throughput analysis.
Exponentially expands the elemental mapping capability for the JEOL 200kV and higher nano-area analysis TEM.
The automatically retractable side entry design allows fast repositioning to avoid irradiation from back-scattered...

Global Supplier For SEM, TEM, NMR, Mass Spec - JEOL USA

JEOL USA Inc. | Global Supplier For SEM, TEM, NMR, Mass Spec JEOL is the leading global supplier of electron microscopes, ion beam instruments, mass spectrometers and NMR spectrometers. Imaging and Analysis Solutions and …

Scanning Electron Microscope SEM - JEOL USA

JSM-IT200 InTouchScope Seamless Navigation, High Throughput SEM Field Emission SEMs NEW! JSM-IT800 Ultrahigh Resolution FE SEM with the most advanced high-resolution analytical technology available today NEW! JSM-IT700HR High Resolution, large chamber FE SEM JSM-7610FPlus Thermal, Analytical FE SEM

Field Emission SEM High Resolution SEM - JEOL USA

High Resolution SEM. The JSM-IT700HR InTouchScope™ Field Emission SEM is a compact, versatile Field Emission SEM that offers Smart-Flexible-Powerful performance at a great value. Our unique in-lens field emission gun and …

EDS Analysis Large Angle SDD-EDS Supplier - JEOL

Key Features High sensitivity, high throughput analysis. Exponentially expands the elemental mapping capability for the JEOL 200kV and higher nano-area analysis TEM. The automatically retractable side entry design allows fast …

JEOL USA High/Low Vacuum Tungsten or LaB6 SEMs

HTTP cookie, also a cookie or cookie, is a simple text file that is stored in a web browser while a user views a website. When a user browses the same site in the future, the site may extract or retrieve information stored in the cookie in order …
specs

JEOL Ltd.

JEOL Ltd. Electron Beam Metal AM Machine JAM-5200EBM High Performance Gas Chromatograph - Time-of-Flight Mass Spectrometer JMS-T2000GC "AccuTOF™ GC-Alpha" "CRYO ARM™ 300 II" JEM-3300 Field Emission Cryo-Electron Microscope APPLICATIONS NOTE JEOL, a world-leading high-end scientific instruments manufacture,

JSM-IT800 Schottky Field Emission Scanning Electron ...

Features. The JSM-IT800 incorporates our "In-lens Schottky Plus field emission electron gun" for high resolution imaging to fast elemental mapping, and an innovative electron optical control system "Neo Engine", as well as a system of seamless GUI "SEM Center" for fast elemental mapping with a fully embedded JEOL energy dispersive X-ray spectrometer (EDS), as a …

Scanning Electron Microscope PRoducts JEOL Ltd.

JSM-IT800 Field Emission Scanning Electron Microscope. JSM-7610FPlus Schottky Field Emission Scanning Electron Microscope. JSM-7610F Schottky Field Emission Scanning Electron Microscope. JSM-IT700HR InTouchScope™ Scanning Electron Microscope. JSM-IT510 InTouchScope™ Scanning Electron Microscope.

JSM-IT510 InTouchScope Scanning Electron ...

Montage function automates large area image collection and stitching of these images into a composite image. Specimen: Fossil of ammonite. Accelerating voltage: 15 kV, Magnification: x150, Signal: BE, Number of field: 13 x 13. * Stage Navigation System (SNS) is needed to display the optical image.

JCM-6000 Versatile Benchtop SEM - JEOL

Compact benchtop SEM Compact size of 325 mm (W) × 490 mm (D) × 430 mm (H) Sleek exterior design External appearance does not change even when EDS is installed

JEOL 2010 - UNM Center for MicroEngineered Materials

Description JEOL 2010 200kV high-resolution transmission electron microscope is capable of a 0.19 nm point-to-point resolution. The instrument is fitted with a GATAN Orius high speed CCD camera for digital image acquisition.

JEOL 6500 Field Emission Gun College of Science and

It operates at 0.5 to 30 kV with an ultimate resolution of 1.5 nm, and a magnification range of 10x to 400,000x. Available image modes include secondary and backscattered electron images, X-Ray mapping, electron backscatter diffraction and cathodoluminescence. Applications: Examination of fracture surfaces.

JEOL 2010f – Atomic Imaging at the University of Texas Austin

Specifications. Source: Schottky Field Emission Imaging Mode: TEM/STEM Voltage: 120/200 KV Cs: 0.5 mm Point Resolution: 0.19 nm Lattice Resolution: 0.14 nm Focused Probe: 0.2 nm Tilt Range: ± 15° Attachments/Accessories. Gatan One-View Camera Oxford X-Max N 80 TLE Windowless SDD EDS Detector Gatan Enfina EELS Detector JEOL Bi-prism

JEOL NeoScope JCM-7000 Scanning Electron Microscope

Equipped with a large sample chamber, both high and low vacuum modes of operation, both secondary and backscatter electron detectors (SED & BSED), real-time 3D imaging, easy to use metrology tools and optional fully-integrated EDS. The JCM-7000 NeoScope is SMART – FLEXIBLE - POWERFUL. SMART– FLEXIBLE – POWERFUL

JEOL JEM-2000EX TEM - Carnegie Mellon University

JEOL JEM-2000EX TEM The JEM 2000EX has an accelerating voltage of 80-200 kV. This instrument has a lattice image resolution of 0.14nm and a point image resolution of 0.28 nm and can be operated at a magnification of 1,000,000 X. Specifications

JEOL JBX-6000 FS/E Electron Beam Lithography Core Facilities

Specs: Accelerating voltage: 50 keV Minimum beam diameter: 5nm Minimum pixel size: 1.25 nm (5th lens), 12.5 nm (4th lens) Field size: 80 x 80 um (5th lens), 800 x 800 um (4th lens) Resolution: 20-30 nm (5th lens)

JEOL 7000F Analytical SEM Materials Research Laboratory

Major Specifications Resolution 1.2nm (30kV) , 1.5 nm (15kV), 3.0 nm (1kV) imaging performance 3.0 nm (15 kV, 10 mm, 5nA) for high resolution analytical performance Accelerating Voltage 0.5 to 30 kV Electron Source Schottky Field Emission Gun Probe Current <1 pA to >200nA Magnification x10 to 500,000

Frequently Asked Questions

Why choose a JEOL scanning electron microscope?

JEOL has played a leading role in the development and evolution of scanning electron microscopes since the early 1960s. JEOL provides valuable applications support, comprehensive training, and award-winning service for the long lifetime of our instruments.
What is JEOL electron beam lithography?

The JEOL Electron Beam Lithography system is capable of providing patterned features with dimensions down to 20nm and pattern to pattern overlay of <40nm. Training on this tool requires pre-requisite training on other techniques: metrology, photoresist coating, metal deposition and SEM analysis.
What is JEOL's analytical series?

Our analytical series includes JEOL’s fully embedded EDS system which provides real time EDS spectra during image observation. With Live Analysis you can: View EDS spectra in real time as you search for the area of interest. Set analysis points, areas, map positions and line scans from the live image observation screen.
Does JEOL have any agency relationship with Ervin Danesh Aryan Company?

2017/05/30　JEOL Ltd. express ourselves that we as JEOL Ltd. and any of our affiliates have concluded no agency relationship and no contractual relationship with Ervin Danesh Aryan Company in Islamic Republic of Iran on our manufactures and sell, services and any others in all cases in the past and current business.