Xeuss 2.0 HR SAXS/WAXS Solid state, “radiation hard” detector allows measurement of the direct beam through a semi-transparent foil on every sample. The instrument will be used to expand the characterization capabilities of the lab, in particular for grazing incidence applications (GISAXS/GIWAXS), 2D WAXS measurements and simultaneous SAXS ...
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The Xeuss 3.0 offers such measuring capability over up to 5 orders in magnitude in q (wave vector) through entirely motorized change of configurations. Any trained user can thus operate the system remotely over its complete measurement range for a given sample or batch of samples. Automatic change of measuring settings include: Q-Xoom change of ...
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Characterize the nanostructure of soft-matter and nanomaterials using SAXS/WAXS and USAXS technique in transmission or grazing incidence mode. – Particle size distribution ranging from few nanometers to more than 350 nm in diameter. – Crystallization rates and lamellar structure of semicrystalline polymers. – Size and shape analysis of ...
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For Xeuss users - example description of data collection parameters: "The wide angle X-ray scattering experiments were performed by using an in-house SAXS/WAXS laboratory system (Xeuss 2.0 HR, Xenocs, France) equipped with a microfocus sealed tube (copper) with X-ray wavelength of 1.54 Å (50 kV, 0.6 mA) and a Pilatus3 R200K detector with a ...
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Sep 26, 2014 . The Xeuss 2.0: The SAXS/WAXS laboratory beam line and is a step forward into high performance SAXS/WAXS measurements in the lab.
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Article Snippet: SAXS and WAXS data were collected simultaneously using a laboratory SAXS/WAXS instrument (Xeuss 2.0, Xenocs, France) equipped with a liquid gallium MetalJet X-ray source (Excillum, Sweden, wavelength λ = 0.134 nm), two sets of motorized scatterless slits for beam collimation, a Dectris Pilatus 1M pixel SAXS detector (sample-to ...
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FCC ID application submitted by Xeuss Mobile (HK) Ltd. for Cellular Phone for FCC ID O5G-HERCULES ( O5G -HERCULES ) User Manual, Frequency, Reports, Images and more.
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Oct 05, 2017 . About Press Copyright Contact us Creators Advertise Developers Terms Privacy Policy & Safety How YouTube works Test new features Press Copyright Contact us Creators ...
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100. X-ray scattering instruments installed since 2013. At Xenocs, we help our customers in their research, development and production of advanced materials by providing them with products and services for characterization at the nanoscale. Our solutions are based on Small and Wide Angle X-ray Scattering (SAXS/WAXS).
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Xeuss Tike User Manual Operation & user’s manual (27 pages) Panasonic KX-NS500 Features Manual Features manual (580 pages) Nokia 8 Sirocco User Manual Operation & user’s manual (74 pages) GE 2-9896 Use & Care Manual Use & care manual (16 pages)
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That's because you live in perpetual victimhood thought process. There are plenty of countries that take refugees based on their religion. Best yet is the United States, through the Lautenberg-Specter amendment extended prosecuted communities of Iran especially Jews, Bahai's, Christians to jump the queue when it comes to naturalization.
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For the most demanding applications, the versatile Xeuss 2.0 is an open platform configuration to provide the most user flexibility.. Complete automation is standard, including: The Q-Xoom feature automates the sample-to-detector distance to maximize collection efficiency from SAXS to WAXS.
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The start.ion.pdb and start.ligand.pdb files may need manual editing to insert the necessary TER cards between each ion or ligand. The new (2007) version of pmb_start is a more intelligent program. It automatically recognizes the standard amino acids, nucleotides, ions, carbohydrates, and waters. All other residues are now placed into the start ...
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Expensive equipment and irreplaceable data are at the core of every deployment. That’s why you need to be sure that you get your assets back and that your recovery system will work. To ensure this, the technical support system at Xeos Technologies is well-equipped, and readily available. The in-house manufacturing and testing facility provides our staff with an extensive knowledge of every ...
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The Xeuss 3.0 integrates a large choice of sample holders and environments. X-ray Scattering Analysis and Calculation Tool. Provide structural tools to a large community of users with full remote operation capability and access to a unique range of length-scales.
The Xeuss 3.0 offers such measuring capability over up to 5 orders in magnitude in q (wave vector) through entirely motorized change of configurations. Any trained user can thus operate the system remotely over its complete measurement range for a given sample or batch of samples.
Overview and Scope This manual describes the operation and installation of the XEL, XE2, XPL, XP2, XML, XM2, 800- 1818 and 800-1819 drives manufactured by Copley Controls. All Xenus plus products have serial numbers that incorporate the week and year of production into the first 4 digits (WWYY) of the serial number.
As a standard solution, Xeuss 3.0 integrates low maintenance microfocus beam delivery systems to provide very high flux levels previously only possible with high power rotating anode sources. Advanced experiments such as kinetic studies or shape analysis of diluted samples can now be performed in the lab.
Typical USAXS beam size is 0.8 x 0.8 mm. Beam size can vary from 1 mm to 0.2 mm in each direction. Note, that small beam sizes are usable for strong scatterers only.
The USAXS/SAXS/WAXS instrument offers world-unique capabilities to wide range of communities in physics, chemistry, materials science, polymers, food science, biology, and many others.
Characterize the nanostructure of soft-matter and nanomaterials using SAXS/WAXS and USAXS technique in transmission or grazing incidence mode. The Xeuss 3.0 integrates a large choice of sample holders and environments. X-ray Scattering Analysis and Calculation Tool.
In GI-SAXS, the incident beam propagates in the surface plane and is constrained to the surface region by evanescence (exponential decay) in the sample depth. The scattering observed on the two-dimensional detector provides structural information limited to ca. 30 nm depth in organic materials.